A process to establish the current carrying capacity
of the connector. This is achieved by determining the temperature
rise resulting at the contact interface at the specified current level.
The temperature rise at a given current level plus the
ambient operating temperature should not excced the temperature
rating of the test sample. Thus the current rating of the system
decreases as the operating ambient increases. this data can also be
unsed to determine potential local "hot spots" internal to the test
sample, possible degradation factors, thermal effects on adjacent areas
and/or the acceptability for use of pulsing techniques.
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Typical test plans