|
A procedure of determining the corrsosion resistance
of the connector interface . The test atmosphere shall be designed to
be very reactive with the copper base alloys. The ensuing resistive
oxides that develop may be monitored through the use of low level
circuit resistance measurements.
A method to determine the impact on electrical stability on contact
interfaces when the test samples are exposed to a caustic single gas
atmosphere. To assure that the gas tight interface once established has
not been disruptive due to external stresses applied to the system via
mechanical and/or environmental means.
For more information on this or any service we provide, please feel
free to contact us at:
phone: (508)
226-4800
or fax: (508)
226-6869
|
|
Tin Whisker
Testing
Company History
Mission
Consultation
Typical test plans
Articles
Recognition
Accreditation
News
Site
Map
|
|