USB TESTING
ABOUT
Aerospace & Military | Automotive | Commercial | Computer | Telecommunications | USB | 1394 The following is a listing of tests which Contech Research performs. For tests not listed, contact us.
The following is a listing of tests which Contech Research performs. For tests not listed, contact us.
Electrical Continuous Monitoring Discontinuity Glitch Detection Nanosecond Event Detection Near Continuous LLCR Near Continuous Voltage Drop High Speed Attenuation (TDT) Capacitance Crosstalk (TDT) Impedance Inductance Propagation Delay (TDR) VSWR (TDR) All TDR and TDT tests, range: to 20 GHz, rise time: 10ps Power Current Carrying Capacity Current Cycling Current Overload Hot Swap Signal Contact Resistance (Rated Current) Low Level Circuit Resistance Voltage Drop Misc. Electrical Dielectric Withstanding Voltage Insulation Resistance Probe Test (LLCR vs. Normal Force)
Mechanical Characterization Contact Gaps Contact Engagement Force Contact Removal Force Contact Retention Force Contact Strength Durability Engagement Force Mating Force Normal Force Resonance Scans Separation Force Unmating Force Vibration at Resonance Compliant / Press-Fit Pins Cross Section Analysis Press-Fit Pin Insertion Press-Fit Pin Retention Test Plan Vibration / Mechanical Shock Contact Chatter Monitoring Drop Test Random Vibration Resonance Scans Sine Vibration Vibration at Resonance Vibration at Temperature Misc. Mechanical Air Pressure (Leakage) Axial Concentricity Crimp Tensile Insert Retention Maintenance Aging Probe Damage
Plating Plating Thickness Porosity Solderability
For more information on this or any service we provide, please feel free to contact us at: email:info@contechresearch.com phone: (508) 226-4800 or fax: (508) 226-6869
Tin Whisker Testing
Company History
Mission
Consultation
Typical test plans
Articles
Recognition
Accreditation
News
Site Map